TEST APPARATUS, CALIBRATION METHOD, PROGRAM, AND R

专利名称：TEST APPARATUS, CALIBRATION METHOD,

PROGRAM, AND RECORDING MEDIUM

发明人：MASAHIRO HABU申请号：US12409512申请日：20090324

公开号：US20100244852A1公开日：20100930

专利附图：

摘要：Provided is a test apparatus, a calibration method, a program causing acomputer to perform as a test apparatus, and a recording medium storing the program.The test apparatus includes a response characteristic detecting section that detects a

difference between a response time of the comparator for a rising waveform and aresponse time of the comparator for a falling waveform, based on measurement results,obtained by the comparator, of the waveforms and corresponding reflected waveforms,The response characteristic detecting section calculates a difference between outputcharacteristics of the rising waveform and the falling waveform output from the driver,based on the measurement results from the comparator of the waveforms and thecorresponding reflected waveforms, and corrects a difference between the responsetimes of the comparator based on the difference between the output characteristics.

申请人：MASAHIRO HABU

地址：Gunma JP

国籍：JP

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